Resistivity measurement of ZnO:AI films for solar cell

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Resistivity measurement of ZnO:AI films for solar cell

Aluminium doped Zinc Oxide films were deposited on glass slide by RF magnetron sputtering using a ZnO target mixed with A120J. All the films were growth in room temperature without intentional heating. The resistivity of the ZnO:AI films were measured using van der Pauw method in terms of the prepar...

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Bibliographic Details
Main Authors:	Tan, Hang Khume, Md. Yusuf, Mohd. Nor, Ismail, Bakar, Wahab, Yussof, Othaman, Zulkafli
Format:	Conference or Workshop Item
Language:	English
Published:	2006
Subjects:	QC Physics
Online Access:	http://eprints.utm.my/9302/ http://eprints.utm.my/9302/1/TanHangKhume2006_ResistivityMeasurementofZnO.pdf

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