A new class of sequential circuits with acyclic test generation complexity

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A new class of sequential circuits with acyclic test generation complexity

This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose test generation complexity is equivalent to that of the acyclic sequential circuits. We also present a test generation proce...

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Bibliographic Details
Main Authors:	Ooi, Chia Yee, Fujiwara, Hideo
Format:	Conference or Workshop Item
Published:	2006
Online Access:	http://eprints.utm.my/9169/

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