Ooi, C. Y., & Fujiwara, H. (2006). A new class of sequential circuits with acyclic test generation complexity.
Chicago Style (17th ed.) CitationOoi, Chia Yee, and Hideo Fujiwara. A New Class of Sequential Circuits with Acyclic Test Generation Complexity. 2006.
MLA (9th ed.) CitationOoi, Chia Yee, and Hideo Fujiwara. A New Class of Sequential Circuits with Acyclic Test Generation Complexity. 2006.
Warning: These citations may not always be 100% accurate.