Surface morphology studies of single and double layer In0.5Ga0.5As/GaAs quantum dots grown by stranski-krastanow growth modes

Single and double layer In0.5Ga0.5As/GaAs QDs with various buffer layer thickness were grown by metal-organic chemical vapor deposition (MOCVD) using Stranski-Krastanow growth mode. The effect of buffer layer thickness on a high density QDs has been investigated using atomic force microscopy (AFM)....

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Main Authors: Aryanto, Didik, Othaman, Zulkafli, Ismail, Abd. Khamim, Muhammad, Rosnita, Saryati, Amira
Format: Book Section
Published: Faculty of Science, Universiti Teknologi Malaysia 2009
Subjects:
Online Access:http://eprints.utm.my/9023/
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author Aryanto, Didik
Othaman, Zulkafli
Ismail, Abd. Khamim
Muhammad, Rosnita
Saryati, Amira
author_facet Aryanto, Didik
Othaman, Zulkafli
Ismail, Abd. Khamim
Muhammad, Rosnita
Saryati, Amira
author_sort Aryanto, Didik
building UTeM Institutional Repository
collection Online Access
description Single and double layer In0.5Ga0.5As/GaAs QDs with various buffer layer thickness were grown by metal-organic chemical vapor deposition (MOCVD) using Stranski-Krastanow growth mode. The effect of buffer layer thickness on a high density QDs has been investigated using atomic force microscopy (AFM). Surface morphology which includes variation in the size and density of the dots on the surface has been studied. A single layer In0.5Ga0.5As QDs with 100 nm and 300 nm GaAs buffer layer shows higher density of QDs with apparently smaller dots size. However, a double layer In0.5Ga0.5As QDs with 25 nm GaAs spacer layer shows different size, uniformity and density compared to a single layer In0.5Ga0.5As QDs. Variation in the surface morphology of the double layer QDs is attributed to the structure of the first QDs and the structure of barrier layer between QDs. Double layer QDs grown using 200 nm GaAs buffer layer and 25 nm spacer layer shows higher dots density and smaller dots in the top most compared to other samples prepared with double layer QDs. This indicates that, the spacer layer structures and dot formation in the under-layer also have important effect on the surface morphology of the double layer (stacked) QDs. However, in the Stranski-Krastanow growth mode, surface morphology and structures of QDs depend strongly on growth parameters.
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format Book Section
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institution Universiti Teknologi Malaysia
institution_category Local University
last_indexed 2025-11-15T21:03:36Z
publishDate 2009
publisher Faculty of Science, Universiti Teknologi Malaysia
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spelling utm-90232011-08-04T02:26:27Z http://eprints.utm.my/9023/ Surface morphology studies of single and double layer In0.5Ga0.5As/GaAs quantum dots grown by stranski-krastanow growth modes Aryanto, Didik Othaman, Zulkafli Ismail, Abd. Khamim Muhammad, Rosnita Saryati, Amira QC Physics Single and double layer In0.5Ga0.5As/GaAs QDs with various buffer layer thickness were grown by metal-organic chemical vapor deposition (MOCVD) using Stranski-Krastanow growth mode. The effect of buffer layer thickness on a high density QDs has been investigated using atomic force microscopy (AFM). Surface morphology which includes variation in the size and density of the dots on the surface has been studied. A single layer In0.5Ga0.5As QDs with 100 nm and 300 nm GaAs buffer layer shows higher density of QDs with apparently smaller dots size. However, a double layer In0.5Ga0.5As QDs with 25 nm GaAs spacer layer shows different size, uniformity and density compared to a single layer In0.5Ga0.5As QDs. Variation in the surface morphology of the double layer QDs is attributed to the structure of the first QDs and the structure of barrier layer between QDs. Double layer QDs grown using 200 nm GaAs buffer layer and 25 nm spacer layer shows higher dots density and smaller dots in the top most compared to other samples prepared with double layer QDs. This indicates that, the spacer layer structures and dot formation in the under-layer also have important effect on the surface morphology of the double layer (stacked) QDs. However, in the Stranski-Krastanow growth mode, surface morphology and structures of QDs depend strongly on growth parameters. Faculty of Science, Universiti Teknologi Malaysia 2009-05 Book Section PeerReviewed Aryanto, Didik and Othaman, Zulkafli and Ismail, Abd. Khamim and Muhammad, Rosnita and Saryati, Amira (2009) Surface morphology studies of single and double layer In0.5Ga0.5As/GaAs quantum dots grown by stranski-krastanow growth modes. In: Proceedings of Second International Conference and Workshops on Basic and Applied Sciences & Regional Annual Fundamental Science Seminar 2009. Faculty of Science, Universiti Teknologi Malaysia, Skudai, Johor, pp. 111-114. ISBN 978‐983‐9805‐74‐1 http:\\www.utm.my
spellingShingle QC Physics
Aryanto, Didik
Othaman, Zulkafli
Ismail, Abd. Khamim
Muhammad, Rosnita
Saryati, Amira
Surface morphology studies of single and double layer In0.5Ga0.5As/GaAs quantum dots grown by stranski-krastanow growth modes
title Surface morphology studies of single and double layer In0.5Ga0.5As/GaAs quantum dots grown by stranski-krastanow growth modes
title_full Surface morphology studies of single and double layer In0.5Ga0.5As/GaAs quantum dots grown by stranski-krastanow growth modes
title_fullStr Surface morphology studies of single and double layer In0.5Ga0.5As/GaAs quantum dots grown by stranski-krastanow growth modes
title_full_unstemmed Surface morphology studies of single and double layer In0.5Ga0.5As/GaAs quantum dots grown by stranski-krastanow growth modes
title_short Surface morphology studies of single and double layer In0.5Ga0.5As/GaAs quantum dots grown by stranski-krastanow growth modes
title_sort surface morphology studies of single and double layer in0.5ga0.5as/gaas quantum dots grown by stranski-krastanow growth modes
topic QC Physics
url http://eprints.utm.my/9023/
http://eprints.utm.my/9023/