Design of wideband reflectometer for a microwave imaging system

The design of a wideband reflectometer for the purpose of inclusion in a microwave imaging system is described. In order to accomplish reflection coefficient measurements over a large frequency band, wideband couplers, dividers and square-law power detectors are assumed to form the reflectometer. Th...

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Main Authors: Seman, NorHudah, Bialkowski, M. E.
Format: Conference or Workshop Item
Published: 2007
Subjects:
Online Access:http://eprints.utm.my/8634/
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author Seman, NorHudah
Bialkowski, M. E.
author_facet Seman, NorHudah
Bialkowski, M. E.
author_sort Seman, NorHudah
building UTeM Institutional Repository
collection Online Access
description The design of a wideband reflectometer for the purpose of inclusion in a microwave imaging system is described. In order to accomplish reflection coefficient measurements over a large frequency band, wideband couplers, dividers and square-law power detectors are assumed to form the reflectometer. The imperfect operation of the chosen configuration of reflectometer is corrected by using a one-port calibration procedure. The operation of non-calibrated and calibrated instruments is studied with the use of Agilent ADS.
first_indexed 2025-11-15T21:02:37Z
format Conference or Workshop Item
id utm-8634
institution Universiti Teknologi Malaysia
institution_category Local University
last_indexed 2025-11-15T21:02:37Z
publishDate 2007
recordtype eprints
repository_type Digital Repository
spelling utm-86342011-11-08T04:50:17Z http://eprints.utm.my/8634/ Design of wideband reflectometer for a microwave imaging system Seman, NorHudah Bialkowski, M. E. TK Electrical engineering. Electronics Nuclear engineering The design of a wideband reflectometer for the purpose of inclusion in a microwave imaging system is described. In order to accomplish reflection coefficient measurements over a large frequency band, wideband couplers, dividers and square-law power detectors are assumed to form the reflectometer. The imperfect operation of the chosen configuration of reflectometer is corrected by using a one-port calibration procedure. The operation of non-calibrated and calibrated instruments is studied with the use of Agilent ADS. 2007 Conference or Workshop Item PeerReviewed Seman, NorHudah and Bialkowski, M. E. (2007) Design of wideband reflectometer for a microwave imaging system. In: 16th Int. Conf. on Microwaves, Radar and Wireless Communications, MIKON 2006, 22-26 May, 2006, Krakow, Poland. http://dx.doi.org/10.1109/MIKON.2006.4345097
spellingShingle TK Electrical engineering. Electronics Nuclear engineering
Seman, NorHudah
Bialkowski, M. E.
Design of wideband reflectometer for a microwave imaging system
title Design of wideband reflectometer for a microwave imaging system
title_full Design of wideband reflectometer for a microwave imaging system
title_fullStr Design of wideband reflectometer for a microwave imaging system
title_full_unstemmed Design of wideband reflectometer for a microwave imaging system
title_short Design of wideband reflectometer for a microwave imaging system
title_sort design of wideband reflectometer for a microwave imaging system
topic TK Electrical engineering. Electronics Nuclear engineering
url http://eprints.utm.my/8634/
http://eprints.utm.my/8634/