Purniawan, A., Hamzah, E., & Mohd Toff, M. R. (2008). Surface roughness and morphology analysis using an atomic force microscopy of polycrystalline diamond coated Si3N4 deposited by microwave plasma assisted chemical vapor deposition. Scitec Publications Ltd.
Chicago Style (17th ed.) CitationPurniawan, A., Esah Hamzah, and Mohd Radzi Mohd Toff. Surface Roughness and Morphology Analysis Using an Atomic Force Microscopy of Polycrystalline Diamond Coated Si3N4 Deposited by Microwave Plasma Assisted Chemical Vapor Deposition. Scitec Publications Ltd, 2008.
MLA (9th ed.) CitationPurniawan, A., et al. Surface Roughness and Morphology Analysis Using an Atomic Force Microscopy of Polycrystalline Diamond Coated Si3N4 Deposited by Microwave Plasma Assisted Chemical Vapor Deposition. Scitec Publications Ltd, 2008.