Wong, Y. J., Saad, I., & Ismail, R. (2006). Characterization of strained silicon MOSFET using semiconductor TCAD tools.
Chicago Style (17th ed.) CitationWong, Yah Jin, Ismail Saad, and Razali Ismail. Characterization of Strained Silicon MOSFET Using Semiconductor TCAD Tools. 2006.
MLA (9th ed.) CitationWong, Yah Jin, et al. Characterization of Strained Silicon MOSFET Using Semiconductor TCAD Tools. 2006.
Warning: These citations may not always be 100% accurate.