$X-ray diffraction study of evaporated cadmium telluride thin films$
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X-ray diffraction study of evaporated cadmium telluride thin films

X-ray diffraction measurement was performed on evaporated CdTe thin films indicating a preferential orientation in (111) direction. The effect of the deposition rate, thickness and substrate temperature was investigated and the film quality was discussed. It was found that as the deposition rate was...

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Bibliographic Details
Main Authors:	Ismail, Bakar, Deraman, Karim, Woon, H. Y.
Format:	Article
Language:	English
Published:	Faculty of Science 2009
Subjects:	QC Physics
Online Access:	http://eprints.utm.my/744/ http://eprints.utm.my/744/1/BBIsmailDeraman2009_XRayDiffractionStudyofEvaporated.pdf

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