APA (7th ed.) Citation

Nagarajan, R., Yaacob, S., Pandian, P., Karthigayan, M., Amin, S., & Khalid, M. (2007). A real time marking inspection scheme for semiconductor industries. Springer.

Chicago Style (17th ed.) Citation

Nagarajan, R., Sazali Yaacob, P. Pandian, M. Karthigayan, Shamsudin Amin, and Marzuki Khalid. A Real Time Marking Inspection Scheme for Semiconductor Industries. Springer, 2007.

MLA (9th ed.) Citation

Nagarajan, R., et al. A Real Time Marking Inspection Scheme for Semiconductor Industries. Springer, 2007.