Wong, K. Y., Okfalisa, O., & Salim, N. (2008). A knowledge diagnostic system for product defects. CRC Press and Taylor & Francis.
Chicago Style (17th ed.) CitationWong, Kuan Yew, Okfalisa Okfalisa, and Naomie Salim. A Knowledge Diagnostic System for Product Defects. CRC Press and Taylor & Francis, 2008.
MLA (9th ed.) CitationWong, Kuan Yew, et al. A Knowledge Diagnostic System for Product Defects. CRC Press and Taylor & Francis, 2008.
Warning: These citations may not always be 100% accurate.