Electrical conductivity measurements in evaporated tin sulphide thin films

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Electrical conductivity measurements in evaporated tin sulphide thin films

Tin sulphide (SnS) has been evaporated on to substrates maintained at fixed temperature in the range 50-300 oC. X-ray diffraction measurements have shown that the films deposited at the lower substrate temperatures are non-stoichiometric, containing higher sulphides of tin, but that those deposited...

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Bibliographic Details
Main Authors:	Deraman, Karim, Sakrani, Samsudi, Ismail, B. B., Wahab, Yusof, Gould, R. D.
Format:	Article
Language:	English
Published:	Taylor & Francis 1994
Subjects:	QC Physics
Online Access:	http://eprints.utm.my/2620/ http://eprints.utm.my/2620/1/international_jurnal_of_electronic.pdf

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