A study on signature analyzer for design for test (DFT)

A study on signature analyzer for design for test (DFT)

This paper takes a look at the use of linear feedback shift registers (LFSR's) as test pattern generators (TPG's) and signature analyzers for built-in self-test (BIST). We also propose a method to generate pseudorandom test patterns. The proposed method can generate longer sequences...

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Bibliographic Details
Main Authors: A'ain, Abu Khari, Lim, C. T., Kok, Hong Ng, Sheng, Kwang Ng, Liew, Eng Yew
Format: Book Section
Language:English
Published: IEEE 2004
Subjects:
TK Electrical engineering. Electronics Nuclear engineering
Online Access:http://eprints.utm.my/1888/
http://eprints.utm.my/1888/1/AbuLimKok2004_StudyOnSignatureAnalyzerForDFT.pdf

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