Development of software system for detecting defective symbols on integrated circuit chip with adjustable readability level

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Development of software system for detecting defective symbols on integrated circuit chip with adjustable readability level

In semiconductor fabrication process, symbol or label inspection is one of the main processes that need to be considered seriously. Errors may occur during the printing process of label or name on the integrated circuit chip (IC). If this occurs, the IC chip may have a wrong name. Providing a reliab...

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Bibliographic Details
Main Authors:	Aris, Ishak, Azri, Maaspaliza, Hasan, Zainab, Hasan, M. K., Khalid, Marzuki, H. M. Amin, Shamsudin, Cyril, H. A.
Format:	Conference or Workshop Item
Language:	English
Published:	2005
Subjects:	TK Electrical engineering. Electronics Nuclear engineering
Online Access:	http://eprints.utm.my/1842/ http://eprints.utm.my/1842/1/aris05_development_of_software_system.pdf

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