APA (7th ed.) Citation

Ahaitouf, A., Bakhtiar, H., Losson, E., & Charles, J. (2003). DLTS and C(t) transient study of defects induced by neutron radiation in MOS structures of CCD technology. Faculty of Science, UTM.

Chicago Style (17th ed.) Citation

Ahaitouf, Aziz, Hazri Bakhtiar, Etienne Losson, and Jean-Pierre Charles. DLTS and C(t) Transient Study of Defects Induced by Neutron Radiation in MOS Structures of CCD Technology. Faculty of Science, UTM, 2003.

MLA (9th ed.) Citation

Ahaitouf, Aziz, et al. DLTS and C(t) Transient Study of Defects Induced by Neutron Radiation in MOS Structures of CCD Technology. Faculty of Science, UTM, 2003.