Characterization of CrAg Bi-layer thin metal contacts sputter deposited on N-type si semiconductor
Good electrical conductivity of metal contacts on semiconductor are very crucial in determining quality of the energy conversion efficiency. This paper reports on the Cr/Ag thin metal contacts properties sputter deposited on n-type Si. The metal contacts were characterized based on the morphological...
| Main Authors: | , |
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| Format: | Article |
| Published: |
Science Publishing Corporation
2018
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| Subjects: | |
| Online Access: | http://eprints.uthm.edu.my/5921/ |