The failure of integrated circuit: test and analysis

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The failure of integrated circuit: test and analysis

Failure analysis (FA) is an important function in the development and manufacturing of integrated circuits. It provides essential information for troubleshooting a complex device while ensuring reliability of a product. The objective of FA is to identify cause of failure and initiate corrective acti...

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Bibliographic Details
Main Author:	Hassan, Hasliza
Format:	Book Section
Language:	English
Published:	Penerbit Uthm 2019
Subjects:	TK7800-8360 Electronics
Online Access:	http://eprints.uthm.edu.my/3586/ http://eprints.uthm.edu.my/3586/1/c%2010%20DONE.pdf

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