Redundant Residue Number System Code for Fault-Tolerant
Hybrid Memories

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Redundant Residue Number System Code for Fault-Tolerant Hybrid Memories

Hybrid memories are envisioned as one of the alternatives to existing semiconductor memories. Although offering enormous data storage capacity, low power consumption, and reduced fabrication complexity (at least for the memory cell array), such memories are subject to a high degree of intermittent a...

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Bibliographic Details
Main Authors:	Haron, Nor Zaidi, Hamdioui, Said
Format:	Article
Language:	English
Published:	Association for Computing Machinery (ACM) 2011
Subjects:	TK Electrical engineering. Electronics Nuclear engineering
Online Access:	http://eprints.utem.edu.my/id/eprint/4525/ http://eprints.utem.edu.my/id/eprint/4525/1/NZBHaron_JETC2011.pdf

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