Logic integrated circuit(IC) functional tester

Bibliographic Details
Main Author: Goh, Siang Wei
Format: Final Year Project / Dissertation / Thesis
Published: 2011
Subjects:
Online Access:http://eprints.utar.edu.my/89/
http://eprints.utar.edu.my/89/1/EE%2D2011%2D0706544%2D1.pdf
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author Goh, Siang Wei
author_facet Goh, Siang Wei
author_sort Goh, Siang Wei
building UTAR Institutional Repository
collection Online Access
first_indexed 2025-11-15T19:18:34Z
format Final Year Project / Dissertation / Thesis
id utar-89
institution Universiti Tunku Abdul Rahman
institution_category Local University
last_indexed 2025-11-15T19:18:34Z
publishDate 2011
recordtype eprints
repository_type Digital Repository
spelling utar-892011-09-08T07:30:28Z Logic integrated circuit(IC) functional tester Goh, Siang Wei TK Electrical engineering. Electronics Nuclear engineering 2011-05 Final Year Project / Dissertation / Thesis NonPeerReviewed application/pdf http://eprints.utar.edu.my/89/1/EE%2D2011%2D0706544%2D1.pdf Goh, Siang Wei (2011) Logic integrated circuit(IC) functional tester. Final Year Project, UTAR. http://eprints.utar.edu.my/89/
spellingShingle TK Electrical engineering. Electronics Nuclear engineering
Goh, Siang Wei
Logic integrated circuit(IC) functional tester
title Logic integrated circuit(IC) functional tester
title_full Logic integrated circuit(IC) functional tester
title_fullStr Logic integrated circuit(IC) functional tester
title_full_unstemmed Logic integrated circuit(IC) functional tester
title_short Logic integrated circuit(IC) functional tester
title_sort logic integrated circuit(ic) functional tester
topic TK Electrical engineering. Electronics Nuclear engineering
url http://eprints.utar.edu.my/89/
http://eprints.utar.edu.my/89/1/EE%2D2011%2D0706544%2D1.pdf