Machine learning approach for automated optical inspection of electronic components

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Machine learning approach for automated optical inspection of electronic components

Rapid development in electronic industry causing a high volume of electronic components being manufactured on each day. Human visual inspection system has been traditionally used in electronic industry for quality control. However, human visual inspection system is affected by inconsistent between d...

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Bibliographic Details
Main Author:	Lim, Siew Kee
Format:	Final Year Project / Dissertation / Thesis
Published:	2019
Subjects:	T Technology (General) TK Electrical engineering. Electronics Nuclear engineering
Online Access:	http://eprints.utar.edu.my/3924/ http://eprints.utar.edu.my/3924/1/fyp_EE_2019_LSK.pdf

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