Lim, S. K. (2019). Machine learning approach for automated optical inspection of electronic components.
Chicago Style (17th ed.) CitationLim, Siew Kee. Machine Learning Approach for Automated Optical Inspection of Electronic Components. 2019.
MLA (9th ed.) CitationLim, Siew Kee. Machine Learning Approach for Automated Optical Inspection of Electronic Components. 2019.
Warning: These citations may not always be 100% accurate.