Comparative Study of Constant Height Mode and Constant Detection Mode in Atomic Force Microscopy (AFM) Imaging.

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Comparative Study of Constant Height Mode and Constant Detection Mode in Atomic Force Microscopy (AFM) Imaging.

Atomic Force Microscopy (AFM) is a kind of Scanning Probe Microscopes (SPM) which is designed to measure local properties of materials, such as height, area, friction and magnetism, using a probe that operates at high resolution. AFM demonstrates scanning resolution on the order of fractions of a na...

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Bibliographic Details
Main Author:	Lau, Sai Yee
Format:	Final Year Project / Dissertation / Thesis
Published:	2016
Subjects:	TK Electrical engineering. Electronics Nuclear engineering
Online Access:	http://eprints.utar.edu.my/2058/ http://eprints.utar.edu.my/2058/1/BEE%2D2016%2D1102029.pdf

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