Development of Low-Cost Precision Scanner System for Scanning Probe Microscopy Application

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Development of Low-Cost Precision Scanner System for Scanning Probe Microscopy Application

Atomic Force Microscope (AFM), also known as “Scanning Force Microscopy (SFM)”. It is a microscope that can measure up to nanometer technology. In AFM, there is a pin, when this pin touches a bump and the pin will rise up. When the pin rise up, the laser that target to the pin and reflect to photodi...

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Bibliographic Details
Main Author:	Kang, Qin Yee
Format:	Final Year Project / Dissertation / Thesis
Published:	2015
Subjects:	TA Engineering (General). Civil engineering (General) TK Electrical engineering. Electronics Nuclear engineering
Online Access:	http://eprints.utar.edu.my/1796/ http://eprints.utar.edu.my/1796/1/Development_of_Low%2DCost_Precision_Scanner_System_for_Scanning_Probe_Microscopy_Application.pdf

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