Microcrack Detection And Noise Reduction In Integrated Circuit Packages

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Microcrack Detection And Noise Reduction In Integrated Circuit Packages

The rise in consumption of electronic products in the recent years have subsequently led to an increase in manufacturing of integrated circuits (ICs) to meet consumers’ demands. Thus, it is vital that each IC is inspected for defects that compromises its quality and usability. This ensures that no d...

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Bibliographic Details
Main Author:	Koh, Ye Sheng
Format:	Monograph
Language:	English
Published:	Universiti Sains Malaysia 2018
Subjects:	T Technology TK Electrical Engineering. Electronics. Nuclear Engineering
Online Access:	http://eprints.usm.my/53577/ http://eprints.usm.my/53577/1/Microcrack%20Detection%20And%20Noise%20Reduction%20In%20Integrated%20Circuit%20Packages_Koh%20Ye%20Sheng_E3_2018.pdf

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