Effect Of Annealing Temperature On Cerium Oxide Thin Films Grown By DC Sputtering Method
The cerium thin films were deposited on n-type Si (100) substrate by direct current (DC) sputtering followed by post-annealing at different temperature (400ᵒC and 600ᵒC, 800ᵒC, 1000ᵒC) in an oxygen ambient. In this study, the effect of annealing temperature on the crystallized CeO2 thin films was c...
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| Format: | Conference or Workshop Item |
| Language: | English |
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2020
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| Online Access: | http://eprints.usm.my/49082/ http://eprints.usm.my/49082/1/ABSTRACT%20BOOK%20MNRG%202020.pdf%20cut%2069.pdf |
| _version_ | 1848881338351878144 |
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| author | Ainita Rozati Mohd, Zabidi Hassan, Zainuriah Lim, Way Foong |
| author_facet | Ainita Rozati Mohd, Zabidi Hassan, Zainuriah Lim, Way Foong |
| author_sort | Ainita Rozati Mohd, Zabidi |
| building | USM Institutional Repository |
| collection | Online Access |
| description | The cerium thin films were deposited on n-type Si (100) substrate by direct current (DC) sputtering followed by post-annealing at different temperature (400ᵒC and
600ᵒC, 800ᵒC, 1000ᵒC) in an oxygen ambient. In this study, the effect of annealing temperature on the crystallized CeO2 thin films was characterized by using grazing incidence X-ray diffraction (GIXRD). The surface topology and surface morphology of the CeO2 were
analyzed by using atomic force microscopy (AFM) and field emission scanning electron microscope (FESEM). The energy bandgap was calculated from the ultraviolet-visible
spectroscopy (UV-Vis) measurement. GIXRD result shows (111) plane has the highest peak intensity, therefore (111) plane was selected as the preferred orientation for CeO2 thin films. AFM results reveal the root-mean-square (RMS) roughness of the CeO2 thin films decreased
as annealing temperature increased from 400ᵒC to 1000ᵒC |
| first_indexed | 2025-11-15T18:17:26Z |
| format | Conference or Workshop Item |
| id | usm-49082 |
| institution | Universiti Sains Malaysia |
| institution_category | Local University |
| language | English |
| last_indexed | 2025-11-15T18:17:26Z |
| publishDate | 2020 |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | usm-490822021-05-04T01:47:34Z http://eprints.usm.my/49082/ Effect Of Annealing Temperature On Cerium Oxide Thin Films Grown By DC Sputtering Method Ainita Rozati Mohd, Zabidi Hassan, Zainuriah Lim, Way Foong QC1-999 Physics The cerium thin films were deposited on n-type Si (100) substrate by direct current (DC) sputtering followed by post-annealing at different temperature (400ᵒC and 600ᵒC, 800ᵒC, 1000ᵒC) in an oxygen ambient. In this study, the effect of annealing temperature on the crystallized CeO2 thin films was characterized by using grazing incidence X-ray diffraction (GIXRD). The surface topology and surface morphology of the CeO2 were analyzed by using atomic force microscopy (AFM) and field emission scanning electron microscope (FESEM). The energy bandgap was calculated from the ultraviolet-visible spectroscopy (UV-Vis) measurement. GIXRD result shows (111) plane has the highest peak intensity, therefore (111) plane was selected as the preferred orientation for CeO2 thin films. AFM results reveal the root-mean-square (RMS) roughness of the CeO2 thin films decreased as annealing temperature increased from 400ᵒC to 1000ᵒC 2020-12-02 Conference or Workshop Item PeerReviewed application/pdf en http://eprints.usm.my/49082/1/ABSTRACT%20BOOK%20MNRG%202020.pdf%20cut%2069.pdf Ainita Rozati Mohd, Zabidi and Hassan, Zainuriah and Lim, Way Foong (2020) Effect Of Annealing Temperature On Cerium Oxide Thin Films Grown By DC Sputtering Method. In: 5th Meeting of Malaysia Nitrides Research Group (MNRG 2020), 1-2 December 2020. |
| spellingShingle | QC1-999 Physics Ainita Rozati Mohd, Zabidi Hassan, Zainuriah Lim, Way Foong Effect Of Annealing Temperature On Cerium Oxide Thin Films Grown By DC Sputtering Method |
| title | Effect Of Annealing Temperature On Cerium Oxide Thin Films Grown By DC Sputtering Method |
| title_full | Effect Of Annealing Temperature On Cerium Oxide Thin Films Grown By DC Sputtering Method |
| title_fullStr | Effect Of Annealing Temperature On Cerium Oxide Thin Films Grown By DC Sputtering Method |
| title_full_unstemmed | Effect Of Annealing Temperature On Cerium Oxide Thin Films Grown By DC Sputtering Method |
| title_short | Effect Of Annealing Temperature On Cerium Oxide Thin Films Grown By DC Sputtering Method |
| title_sort | effect of annealing temperature on cerium oxide thin films grown by dc sputtering method |
| topic | QC1-999 Physics |
| url | http://eprints.usm.my/49082/ http://eprints.usm.my/49082/1/ABSTRACT%20BOOK%20MNRG%202020.pdf%20cut%2069.pdf |