Electrode-Less Photo-Assisted Etching Of P-Type And N-Type GaN

Poor light extraction due to total internal reflection (TIR) phenomenon has become a major problem in InGaN/GaN light-emitting diode (LED) [1-2]. Surface texturing by photoelectrochemical (PEC) etching gives access to more than 70% improvement in light extraction as reported in [3]. In this work, an...

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Main Authors: Ibrahim, N., Ikram Md Taib, M., Waheeda, S. N., Alias, E. A., Zainal, N.
Format: Conference or Workshop Item
Language:English
Published: 2019
Subjects:
Online Access:http://eprints.usm.my/48905/
http://eprints.usm.my/48905/1/ICoSeMT%202019%20ABSTRACT%20BOOK%2099.pdf
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author Ibrahim, N.
Ikram Md Taib, M.
Waheeda, S. N.
Alias, E. A.
Zainal, N.
author_facet Ibrahim, N.
Ikram Md Taib, M.
Waheeda, S. N.
Alias, E. A.
Zainal, N.
author_sort Ibrahim, N.
building USM Institutional Repository
collection Online Access
description Poor light extraction due to total internal reflection (TIR) phenomenon has become a major problem in InGaN/GaN light-emitting diode (LED) [1-2]. Surface texturing by photoelectrochemical (PEC) etching gives access to more than 70% improvement in light extraction as reported in [3]. In this work, an electrode-less photo-assisted etching is demonstrated on Ga-polar face of n-type and p-type GaN layers. Two type of etchant solutions, H3PO4 with KOH and H3PO4 with HNO3 were used and the surface morphology of all samples were measured using scanning electron microscopy (SEM). Hexagonal pit on the surface of all samples were observed. Interestingly, the pits were formed in various uniformity, density and size depending on the type of solution. Surface roughness of etch samples is improved after etching as measured using atomic force microscopy (AFM).
first_indexed 2025-11-15T18:16:38Z
format Conference or Workshop Item
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institution Universiti Sains Malaysia
institution_category Local University
language English
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publishDate 2019
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spelling usm-489052021-04-15T07:29:56Z http://eprints.usm.my/48905/ Electrode-Less Photo-Assisted Etching Of P-Type And N-Type GaN Ibrahim, N. Ikram Md Taib, M. Waheeda, S. N. Alias, E. A. Zainal, N. QC1-999 Physics Poor light extraction due to total internal reflection (TIR) phenomenon has become a major problem in InGaN/GaN light-emitting diode (LED) [1-2]. Surface texturing by photoelectrochemical (PEC) etching gives access to more than 70% improvement in light extraction as reported in [3]. In this work, an electrode-less photo-assisted etching is demonstrated on Ga-polar face of n-type and p-type GaN layers. Two type of etchant solutions, H3PO4 with KOH and H3PO4 with HNO3 were used and the surface morphology of all samples were measured using scanning electron microscopy (SEM). Hexagonal pit on the surface of all samples were observed. Interestingly, the pits were formed in various uniformity, density and size depending on the type of solution. Surface roughness of etch samples is improved after etching as measured using atomic force microscopy (AFM). 2019-04-30 Conference or Workshop Item PeerReviewed application/pdf en http://eprints.usm.my/48905/1/ICoSeMT%202019%20ABSTRACT%20BOOK%2099.pdf Ibrahim, N. and Ikram Md Taib, M. and Waheeda, S. N. and Alias, E. A. and Zainal, N. (2019) Electrode-Less Photo-Assisted Etching Of P-Type And N-Type GaN. In: International Conference On Semiconductor Materials Technology.
spellingShingle QC1-999 Physics
Ibrahim, N.
Ikram Md Taib, M.
Waheeda, S. N.
Alias, E. A.
Zainal, N.
Electrode-Less Photo-Assisted Etching Of P-Type And N-Type GaN
title Electrode-Less Photo-Assisted Etching Of P-Type And N-Type GaN
title_full Electrode-Less Photo-Assisted Etching Of P-Type And N-Type GaN
title_fullStr Electrode-Less Photo-Assisted Etching Of P-Type And N-Type GaN
title_full_unstemmed Electrode-Less Photo-Assisted Etching Of P-Type And N-Type GaN
title_short Electrode-Less Photo-Assisted Etching Of P-Type And N-Type GaN
title_sort electrode-less photo-assisted etching of p-type and n-type gan
topic QC1-999 Physics
url http://eprints.usm.my/48905/
http://eprints.usm.my/48905/1/ICoSeMT%202019%20ABSTRACT%20BOOK%2099.pdf