Properties of p-GaN Layer on Different Nitride Surfaces

Achieving high-quality p-type GaN (p-GaN) layer is crucial for development of nitrides-based optoelectronic and power devices like as light-emitting diodes (LEOs). laser, transistor and so forth. Although, nitride based devices are commonly grown on foreign substrates e.g. sapphire, growing the n...

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Main Authors: Fatihah, N., Zainal, N., Hassan, Z.
Format: Conference or Workshop Item
Language:English
Published: 2015
Subjects:
Online Access:http://eprints.usm.my/48437/
http://eprints.usm.my/48437/1/Section%20C%20154.pdf%20cut.pdf
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author Fatihah, N.
Zainal, N.
Hassan, Z.
author_facet Fatihah, N.
Zainal, N.
Hassan, Z.
author_sort Fatihah, N.
building USM Institutional Repository
collection Online Access
description Achieving high-quality p-type GaN (p-GaN) layer is crucial for development of nitrides-based optoelectronic and power devices like as light-emitting diodes (LEOs). laser, transistor and so forth. Although, nitride based devices are commonly grown on foreign substrates e.g. sapphire, growing the nitrides based devices in cheap substrate like silicon (Si) is more preferable as it can promote the devices production at low-cost level. Apart from that, Si substrate provides good thermal conductivity, easier fabrication and available in larger wafer size. It should be concerned that, the nitrides grown on Si substrate usually suffer from large lattice mismatch that causes crack and defects in the overgrown GaN layer. To overcome the problem, we propose to use aluminum nitride (AIN) as the buffer layer for p-GaN layer. In this work, we investigate the structural, optical and electrical properties of p-GaN layer grown on different nitrides surfaces using Si and sapphire substrates for comparison. Towards the end, the prospective of the p-GaN layer on AIN/Si substrate will be determined.
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publishDate 2015
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spelling usm-484372021-02-24T07:07:03Z http://eprints.usm.my/48437/ Properties of p-GaN Layer on Different Nitride Surfaces Fatihah, N. Zainal, N. Hassan, Z. QC1 Physics (General) Achieving high-quality p-type GaN (p-GaN) layer is crucial for development of nitrides-based optoelectronic and power devices like as light-emitting diodes (LEOs). laser, transistor and so forth. Although, nitride based devices are commonly grown on foreign substrates e.g. sapphire, growing the nitrides based devices in cheap substrate like silicon (Si) is more preferable as it can promote the devices production at low-cost level. Apart from that, Si substrate provides good thermal conductivity, easier fabrication and available in larger wafer size. It should be concerned that, the nitrides grown on Si substrate usually suffer from large lattice mismatch that causes crack and defects in the overgrown GaN layer. To overcome the problem, we propose to use aluminum nitride (AIN) as the buffer layer for p-GaN layer. In this work, we investigate the structural, optical and electrical properties of p-GaN layer grown on different nitrides surfaces using Si and sapphire substrates for comparison. Towards the end, the prospective of the p-GaN layer on AIN/Si substrate will be determined. 2015-06 Conference or Workshop Item PeerReviewed application/pdf en http://eprints.usm.my/48437/1/Section%20C%20154.pdf%20cut.pdf Fatihah, N. and Zainal, N. and Hassan, Z. (2015) Properties of p-GaN Layer on Different Nitride Surfaces. In: Meeting of Malaysia Nitrides Research Group.
spellingShingle QC1 Physics (General)
Fatihah, N.
Zainal, N.
Hassan, Z.
Properties of p-GaN Layer on Different Nitride Surfaces
title Properties of p-GaN Layer on Different Nitride Surfaces
title_full Properties of p-GaN Layer on Different Nitride Surfaces
title_fullStr Properties of p-GaN Layer on Different Nitride Surfaces
title_full_unstemmed Properties of p-GaN Layer on Different Nitride Surfaces
title_short Properties of p-GaN Layer on Different Nitride Surfaces
title_sort properties of p-gan layer on different nitride surfaces
topic QC1 Physics (General)
url http://eprints.usm.my/48437/
http://eprints.usm.my/48437/1/Section%20C%20154.pdf%20cut.pdf