Thermal And Flicker Noise Analysis In Sample And Hold Circuit

Thermal And Flicker Noise Analysis In Sample And Hold Circuit

In low-frequency applications, noise is becoming more of an issue as the MOS size reduced. Therefore, the flicker noise and thermal noise are one of the issues found in low-frequency applications. In this work, the thermal noise and flicker noise are modelled and measured on the sample-and-hold c...

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Bibliographic Details
Main Author: Maniam, Balamurali
Format: Thesis
Language:English
Published: 2015
Subjects:
T Technology (General)
TK1-9971 Electrical engineering. Electronics. Nuclear engineering
Online Access:http://eprints.usm.my/46871/
http://eprints.usm.my/46871/1/Thermal%20And%20Flicker%20Noise%20Analysis%20In%20Sample%20And%20Hold%20Circuit.pdf

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