Development Of Interaction Test Data Generation Strategy With Input-Output Mapping Supports

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Development Of Interaction Test Data Generation Strategy With Input-Output Mapping Supports

Uniform strength t-way testing (where t represents interaction strength) forms the basis of interaction testing. However, t is rarely uniform in real world as not all interaction faults are solely constituted by these fixed t-interactions. Consequently, a general solution has been introduced: input-...

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Bibliographic Details
Main Author:	Ong, Hui Yeh
Format:	Thesis
Language:	English
Published:	2012
Subjects:	TK1-9971 Electrical engineering. Electronics. Nuclear engineering
Online Access:	http://eprints.usm.my/46327/ http://eprints.usm.my/46327/1/ONG%20HUI%20YEH_HJ.pdf

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