Fabrication And Physical Characterisation Of Zinc Oxide Thin Films
Zinc oxide (ZnO) thin films were deposited on α-0001 sapphire substrates using direct current (d.c.) magnetron sputtering process and annealed at various temperatures in an inert atmosphere to investigate its effect on the ultraviolet (UV) emission, stress, lattice constants, crystallite size as wel...
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| Format: | Thesis |
| Language: | English |
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2012
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| Online Access: | http://eprints.usm.my/41953/ http://eprints.usm.my/41953/1/LIM_YAM_TEE.pdf |
| _version_ | 1848879430015909888 |
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| author | Lim , Yam Tee |
| author_facet | Lim , Yam Tee |
| author_sort | Lim , Yam Tee |
| building | USM Institutional Repository |
| collection | Online Access |
| description | Zinc oxide (ZnO) thin films were deposited on α-0001 sapphire substrates using direct current (d.c.) magnetron sputtering process and annealed at various temperatures in an inert atmosphere to investigate its effect on the ultraviolet (UV) emission, stress, lattice constants, crystallite size as well as the possibility of inducing nanostructure growth. Scanning electron microscope (SEM) and X-ray diffraction (XRD) found that ZnO thin films have a fairly uniform granular surface structure with a preferential c-axis growth direction. |
| first_indexed | 2025-11-15T17:47:06Z |
| format | Thesis |
| id | usm-41953 |
| institution | Universiti Sains Malaysia |
| institution_category | Local University |
| language | English |
| last_indexed | 2025-11-15T17:47:06Z |
| publishDate | 2012 |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | usm-419532019-04-12T05:26:23Z http://eprints.usm.my/41953/ Fabrication And Physical Characterisation Of Zinc Oxide Thin Films Lim , Yam Tee LC5800-5808 Distance education. Zinc oxide (ZnO) thin films were deposited on α-0001 sapphire substrates using direct current (d.c.) magnetron sputtering process and annealed at various temperatures in an inert atmosphere to investigate its effect on the ultraviolet (UV) emission, stress, lattice constants, crystallite size as well as the possibility of inducing nanostructure growth. Scanning electron microscope (SEM) and X-ray diffraction (XRD) found that ZnO thin films have a fairly uniform granular surface structure with a preferential c-axis growth direction. 2012-03 Thesis NonPeerReviewed application/pdf en http://eprints.usm.my/41953/1/LIM_YAM_TEE.pdf Lim , Yam Tee (2012) Fabrication And Physical Characterisation Of Zinc Oxide Thin Films. Masters thesis, Universiti Sains Malaysia. |
| spellingShingle | LC5800-5808 Distance education. Lim , Yam Tee Fabrication And Physical Characterisation Of Zinc Oxide Thin Films |
| title | Fabrication And Physical Characterisation Of Zinc Oxide Thin Films |
| title_full | Fabrication And Physical Characterisation Of Zinc Oxide Thin Films |
| title_fullStr | Fabrication And Physical Characterisation Of Zinc Oxide Thin Films |
| title_full_unstemmed | Fabrication And Physical Characterisation Of Zinc Oxide Thin Films |
| title_short | Fabrication And Physical Characterisation Of Zinc Oxide Thin Films |
| title_sort | fabrication and physical characterisation of zinc oxide thin films |
| topic | LC5800-5808 Distance education. |
| url | http://eprints.usm.my/41953/ http://eprints.usm.my/41953/1/LIM_YAM_TEE.pdf |