Optimization Of Potassium Hydroxide (KOH) Etching On The Fabrication Of P-Type Silicon Nanowire Transistor Patterned By Atomic Force Microscopy Lithography
Silicon nanowire transistor (SiNWT) has been successfully fabricated by atomic force microscopy (AFM) lithography through wet etching process. The silicon on insulator (SOI) <100> wafer was used as a starting material. Prior to use, the SOI wafer was cleaned by using ammonium hydroxide (NH4OH)...
| Main Author: | Abdullah, Ahmad Makarimi |
|---|---|
| Format: | Thesis |
| Language: | English |
| Published: |
2012
|
| Subjects: | |
| Online Access: | http://eprints.usm.my/41348/ http://eprints.usm.my/41348/1/AHMAD_MAKARIMI_ABDULLAH.pdf |
Similar Items
Optimization Of Potassium Hydroxide (Koh) Etching On The Fabrication Of P-Type Silicon Nanowire Transistor Patterned By Atomic Force Microscopy Lithography
by: Abdullah, Ahmad Makarimi
Published: (2012)
by: Abdullah, Ahmad Makarimi
Published: (2012)
Etching Effect On The Formation Of Silicon Nanowire Transistor Patterned By AFM Lithography.
by: Abdullah, A. Makarimi, et al.
Published: (2010)
by: Abdullah, A. Makarimi, et al.
Published: (2010)
Effect Of Tetramethylammonium Hydroxide (TMAH) Etchant On The Formation Of Silicon Nanowires Transistor Patterned By Atomic Force Microscopy (AFM)
Lithography
by: Lew, Kam Chung
Published: (2011)
by: Lew, Kam Chung
Published: (2011)
Study the characteristic of p-type junction-less side gate silicon nanowire transistor fabricated by atomic force microscopy lithography
by: Dehzangi, Arash, et al.
Published: (2011)
by: Dehzangi, Arash, et al.
Published: (2011)
Fabrication and simulation of P-type junctionless silicon nanowire transistor using silicon on insulator and atomic force microscope nano lithography
by: Dehzangi, Arash
Published: (2012)
by: Dehzangi, Arash
Published: (2012)
Fabrication of p-type Double gate and Single gate Junctionless silicon nanowire transistor by Atomic force microscopy nanolithography
by: Dehzangi, Arash, et al.
Published: (2013)
by: Dehzangi, Arash, et al.
Published: (2013)
Field effect in silicon nanostructure fabricated by atomic force microscopy nano lithography
by: Dehzangi, Arash, et al.
Published: (2011)
by: Dehzangi, Arash, et al.
Published: (2011)
Pinch-off effect in p-type double gate and single gate junctionless silicon nanowire transistor fabricated by atomic force microscopy nanolithography
by: Larki, Farhad, et al.
Published: (2013)
by: Larki, Farhad, et al.
Published: (2013)
Effect of TMAH etching duration on the formation of silicon nanowire transistor patterned by AFM nanolithography
by: Sabar Hutagalung, D., et al.
Published: (2012)
by: Sabar Hutagalung, D., et al.
Published: (2012)
Optimization of the process modules for a top-down silicon
nanowire fabrication using optical lithography and
orientation dependent etching
by: Za'bah, Nor Farahidah, et al.
Published: (2013)
by: Za'bah, Nor Farahidah, et al.
Published: (2013)
Characterization of silicon nanowire transistor
by: Al Ariqi, Hani Taha, et al.
Published: (2019)
by: Al Ariqi, Hani Taha, et al.
Published: (2019)
Silicon nanohole arrays fabricated by electron beam
lithography and reactive ion etching
by: Lita Rahmasari,, et al.
Published: (2019)
by: Lita Rahmasari,, et al.
Published: (2019)
An alternative polymeric protection mask for bulk KOH etching of silicon
by: Ab Rahim, Rosminazuin, et al.
Published: (2012)
by: Ab Rahim, Rosminazuin, et al.
Published: (2012)
Top-down fabrication of single crystal silicon nanowire using optical lithography
by: Za'bah, Nor Farahidah, et al.
Published: (2012)
by: Za'bah, Nor Farahidah, et al.
Published: (2012)
Nanoscale patterning by AFM lithography and its application
on the fabrication of silicon nanowire devices
by: Sabar D. Hutagalung,, et al.
Published: (2014)
by: Sabar D. Hutagalung,, et al.
Published: (2014)
Design And Characterization Of Silicon Nanowire Transistor And Logic Nanowire Inverter Circuits
by: Naif, Yasir Hashim
Published: (2013)
by: Naif, Yasir Hashim
Published: (2013)
Impact of KOH etching on nanostructure fabricated by local
anodic oxidation method
by: Dehzangi, Arash, et al.
Published: (2013)
by: Dehzangi, Arash, et al.
Published: (2013)
A new factor for fabrication technologies evaluation for silicon nanowire transistors
by: Hashim, Yasir, et al.
Published: (2020)
by: Hashim, Yasir, et al.
Published: (2020)
A new factor for fabrication technologies evaluation for silicon nanowire transistors.
by: yasir, Hashim, et al.
Published: (2020)
by: yasir, Hashim, et al.
Published: (2020)
Simulation of transport in laterally gated junctionless transistors fabricated by local anodization with an atomic force microscope
by: Larki, Farhad, et al.
Published: (2013)
by: Larki, Farhad, et al.
Published: (2013)
Top-down fabrication of silicon nanowire sensor using electron beam and optical mixed lithography
by: Abd Rahman, Siti Fatimah, et al.
Published: (2014)
by: Abd Rahman, Siti Fatimah, et al.
Published: (2014)
The study on the aspect ratio of Atomic Force Microscope (AFM) measurements for Triangular Silicon Nanowire
by: Za'bah, Nor Farahidah, et al.
Published: (2013)
by: Za'bah, Nor Farahidah, et al.
Published: (2013)
Temperature characteristics of silicon nanowire transistor depending on oxide thickness
by: AlAriqi, Hani Taha, et al.
Published: (2019)
by: AlAriqi, Hani Taha, et al.
Published: (2019)
Temperature sensitivity of silicon nanowire transistor based on channel length
by: AlAriqi, Hani Taha, et al.
Published: (2019)
by: AlAriqi, Hani Taha, et al.
Published: (2019)
Fabrication and simulation of lithographically defined junctionless lateral gate silicon nanowire transistors
by: Larki, Farhad
Published: (2012)
by: Larki, Farhad
Published: (2012)
ProTEK PSB coating as an alternative polymeric protection
mask for KOH bulk etching of silicon
by: Ab Rahim, Rosminazuin, et al.
Published: (2013)
by: Ab Rahim, Rosminazuin, et al.
Published: (2013)
Characterisation of Gelation by Atomic Force Microscopy
by: Barker, Emily Clare
Published: (2020)
by: Barker, Emily Clare
Published: (2020)
Forces at the nanoscale : interactions in atomic force microscopy and dielectrophoresis
by: Sweetman, Adam
Published: (2010)
by: Sweetman, Adam
Published: (2010)
Influence Of Molarity And Time Of Potassium Hydroxide Etching On Al-Rich AlGaN Layer
by: Yusuf, Yusnizam, et al.
Published: (2020)
by: Yusuf, Yusnizam, et al.
Published: (2020)
Fast spiral-scan atomic force microscopy
by: Mahmood, Iskandar Al-Thani, et al.
Published: (2009)
by: Mahmood, Iskandar Al-Thani, et al.
Published: (2009)
The Use of Atomic Force Microscopy in Corrosion Research
by: Kinsella, Brian, et al.
Published: (2009)
by: Kinsella, Brian, et al.
Published: (2009)
Electrical and temperature characterisation of silicon and germanium nanowire transistors based on channel dimensions
by: Hani Taha, Abd Assamad Al Ariqi
Published: (2020)
by: Hani Taha, Abd Assamad Al Ariqi
Published: (2020)
Atomic force microscopy investigations of peptide self-assembly
by: Sedman, Victoria L.
Published: (2006)
by: Sedman, Victoria L.
Published: (2006)
Quantification of cell-substratum interactions by atomic force microscopy
by: Li, Q., et al.
Published: (2017)
by: Li, Q., et al.
Published: (2017)
Working principle and operating mode of atomic force microscopy
by: Mahmood, Iskandar Al-Thani
Published: (2011)
by: Mahmood, Iskandar Al-Thani
Published: (2011)
Simulating solid-liquid interfaces in atomic force microscopy
by: Reischl, Bernhard, et al.
Published: (2015)
by: Reischl, Bernhard, et al.
Published: (2015)
Can Point Defects in Surfaces in Solution be Atomically Resolved by Atomic Force Microscopy?
by: Reischl, Bernhard, et al.
Published: (2016)
by: Reischl, Bernhard, et al.
Published: (2016)
Etching performance of silicon wafers with redesigned etching drum
by: Dolah, Rozzeta
Published: (2006)
by: Dolah, Rozzeta
Published: (2006)
The application of atomic force microscopy in the surface analysis of polymeric biomaterials
by: Shakesheff, Kevin
Published: (1995)
by: Shakesheff, Kevin
Published: (1995)
A new scanning method for fast atomic force microscopy
by: Mahmood, Iskandar Al-Thani, et al.
Published: (2011)
by: Mahmood, Iskandar Al-Thani, et al.
Published: (2011)
Similar Items
-
Optimization Of Potassium Hydroxide (Koh) Etching On The Fabrication Of P-Type Silicon Nanowire Transistor Patterned By Atomic Force Microscopy Lithography
by: Abdullah, Ahmad Makarimi
Published: (2012) -
Etching Effect On The Formation Of Silicon Nanowire Transistor Patterned By AFM Lithography.
by: Abdullah, A. Makarimi, et al.
Published: (2010) -
Effect Of Tetramethylammonium Hydroxide (TMAH) Etchant On The Formation Of Silicon Nanowires Transistor Patterned By Atomic Force Microscopy (AFM)
Lithography
by: Lew, Kam Chung
Published: (2011) -
Study the characteristic of p-type junction-less side gate silicon nanowire transistor fabricated by atomic force microscopy lithography
by: Dehzangi, Arash, et al.
Published: (2011) -
Fabrication and simulation of P-type junctionless silicon nanowire transistor using silicon on insulator and atomic force microscope nano lithography
by: Dehzangi, Arash
Published: (2012)