On-wafer noise figure characterization for radio frequency integrated circuits.

Kaedah nyah-benaman pengukuran Angka Hingar (AH) atas-wafer untuk Litar Bersepadu Frekuensi Radio (LBFR) dibentangkan dalam tesis ini. Ini diikuti dengan analisa ketakpastian gandaan untuk menyiasat pengaruh pengukuran skalar dan vektor terhadap AH. A de-embedding method of an on-wafer Noise Figu...

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Main Author: Mohd, Shukri Korakkottil Kunhi
Format: Thesis
Language:English
Published: 2011
Subjects:
Online Access:http://eprints.usm.my/41103/
http://eprints.usm.my/41103/1/On-wafer_noise_figure_characterization_for_radio_frequency_integrated_circuits..pdf
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author Mohd, Shukri Korakkottil Kunhi
author_facet Mohd, Shukri Korakkottil Kunhi
author_sort Mohd, Shukri Korakkottil Kunhi
building USM Institutional Repository
collection Online Access
description Kaedah nyah-benaman pengukuran Angka Hingar (AH) atas-wafer untuk Litar Bersepadu Frekuensi Radio (LBFR) dibentangkan dalam tesis ini. Ini diikuti dengan analisa ketakpastian gandaan untuk menyiasat pengaruh pengukuran skalar dan vektor terhadap AH. A de-embedding method of an on-wafer Noise Figure (NF) measurement for Radio Frequency Integrated Circuit (RFIC) is presented in this thesis. This is then followed by gain uncertainty analysis to investigate the influences of scalar and vector measurements on the NF.
first_indexed 2025-11-15T17:43:29Z
format Thesis
id usm-41103
institution Universiti Sains Malaysia
institution_category Local University
language English
last_indexed 2025-11-15T17:43:29Z
publishDate 2011
recordtype eprints
repository_type Digital Repository
spelling usm-411032018-07-26T06:51:07Z http://eprints.usm.my/41103/ On-wafer noise figure characterization for radio frequency integrated circuits. Mohd, Shukri Korakkottil Kunhi TK1-9971 Electrical engineering. Electronics. Nuclear engineering Kaedah nyah-benaman pengukuran Angka Hingar (AH) atas-wafer untuk Litar Bersepadu Frekuensi Radio (LBFR) dibentangkan dalam tesis ini. Ini diikuti dengan analisa ketakpastian gandaan untuk menyiasat pengaruh pengukuran skalar dan vektor terhadap AH. A de-embedding method of an on-wafer Noise Figure (NF) measurement for Radio Frequency Integrated Circuit (RFIC) is presented in this thesis. This is then followed by gain uncertainty analysis to investigate the influences of scalar and vector measurements on the NF. 2011-03 Thesis NonPeerReviewed application/pdf en http://eprints.usm.my/41103/1/On-wafer_noise_figure_characterization_for_radio_frequency_integrated_circuits..pdf Mohd, Shukri Korakkottil Kunhi (2011) On-wafer noise figure characterization for radio frequency integrated circuits. Masters thesis, Universiti Sains Malaysia.
spellingShingle TK1-9971 Electrical engineering. Electronics. Nuclear engineering
Mohd, Shukri Korakkottil Kunhi
On-wafer noise figure characterization for radio frequency integrated circuits.
title On-wafer noise figure characterization for radio frequency integrated circuits.
title_full On-wafer noise figure characterization for radio frequency integrated circuits.
title_fullStr On-wafer noise figure characterization for radio frequency integrated circuits.
title_full_unstemmed On-wafer noise figure characterization for radio frequency integrated circuits.
title_short On-wafer noise figure characterization for radio frequency integrated circuits.
title_sort on-wafer noise figure characterization for radio frequency integrated circuits.
topic TK1-9971 Electrical engineering. Electronics. Nuclear engineering
url http://eprints.usm.my/41103/
http://eprints.usm.my/41103/1/On-wafer_noise_figure_characterization_for_radio_frequency_integrated_circuits..pdf