Development Of Laser Assisted Device Alteration (Lada) Technique For Failure Region Identification In Integrated Circuit

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Development Of Laser Assisted Device Alteration (Lada) Technique For Failure Region Identification In Integrated Circuit

The purpose of this research is to create a solution for some of the obstacles faced during Integrated Circuit (IC) Failure Analysis (FA). Faults in ICs increase proportionally with the growing number of transistors, narrower process margins and increasing complexity of IC design. The IC industry de...

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Bibliographic Details
Main Author:	Thor , Man Hon
Format:	Thesis
Language:	English
Published:	2015
Subjects:	TK7800-8360 Electronics
Online Access:	http://eprints.usm.my/40968/ http://eprints.usm.my/40968/1/THOR_MAN_HON_24_pages.pdf

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