Evaluation Of 28nm 10 Bit Adc Using Ramp And Sinusoidal Histogram Methodologies

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Evaluation Of 28nm 10 Bit Adc Using Ramp And Sinusoidal Histogram Methodologies

ADC production testing has become more challenging due to more stringent test procedure for new generation of ADC. The trend for silicon cost is going down while the cost of test is going up. Therefore, to reduce the cost of test and preserve the test accuracy is essential for high volume testing in...

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Bibliographic Details
Main Author:	Wan Ismail, Wan Mohd Fahmi
Format:	Thesis
Language:	English
Published:	2015
Subjects:	TK7800-8360 Electronics
Online Access:	http://eprints.usm.my/40967/ http://eprints.usm.my/40967/1/WAN_MOHD_FAHMI_BIN_WAN_ISMAIL_24_pages.pdf

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