Development Of Test Platform Of Fpga Interconnect To Capture Marginal Open Defect

Development Of Test Platform Of Fpga Interconnect To Capture Marginal Open Defect

This research highlights the development of test platform of FPGA interconnect to capture marginal open defect on Altera® Stratix V devices. The need for at-speed test was due to the increasing number of marginal open defects, resulting from manufacturing process complexity anticipated from continu...

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Bibliographic Details
Main Author: Mohamed Sultan, Fahmy Hafriz
Format: Thesis
Language:English
Published: 2015
Subjects:
TK7800-8360 Electronics
Online Access:http://eprints.usm.my/40813/
http://eprints.usm.my/40813/1/FAHMY_HAFRIZ_BIN_MOHAMED_SULTAN_24_pages.pdf

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