Exploring High Resolution Test Pattern To Improve The Cache Failure Analysis

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Exploring High Resolution Test Pattern To Improve The Cache Failure Analysis

Typically, only pass/fail basis test algorithm is being used to test the cache array in silicon devices. But the pass/fail basis test algorithm is insufficient to identify the failing characteristic of the cache array when it comes to the failure analysis (FA) and debug stage to find out the root ca...

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Bibliographic Details
Main Author:	Ong, Chein Ee
Format:	Thesis
Language:	English
Published:	2017
Subjects:	TK1-9971 Electrical engineering. Electronics. Nuclear engineering
Online Access:	http://eprints.usm.my/39576/ http://eprints.usm.my/39576/1/ONG_CHEIN_EE_24_Pages.pdf

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