Fault Isolation with ‘X’ Filter for Bogus Signals and Intensive Scan Cell Sequence Validation

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Fault Isolation with ‘X’ Filter for Bogus Signals and Intensive Scan Cell Sequence Validation

There are some concerns in silicon data collection by using the Design-For-Test (DFT). Bogus signal which carries ‘x’ value in simulation, results from the complex logic synthesis and power-up floating state can often mislead the fault isolation process with invalid failing condition. Besides, scan...

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Bibliographic Details
Main Author:	Khor , Wooi Kin
Format:	Thesis
Language:	English
Published:	2017
Subjects:	TK1-9971 Electrical engineering. Electronics. Nuclear engineering
Online Access:	http://eprints.usm.my/39412/ http://eprints.usm.my/39412/1/Khor_Wooi_Kin_24_Pages.pdf

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