Saw , K. G. (2017). Fundamental analysis of semiconductor-metal transition in indium-doped zinc oxide using carrier concentration and current-voltage measurements. Universiti Sains Malaysia.
Chicago Style (17th ed.) CitationSaw , Kim Guan. Fundamental Analysis of Semiconductor-metal Transition in Indium-doped Zinc Oxide Using Carrier Concentration and Current-voltage Measurements. Universiti Sains Malaysia, 2017.
MLA (9th ed.) CitationSaw , Kim Guan. Fundamental Analysis of Semiconductor-metal Transition in Indium-doped Zinc Oxide Using Carrier Concentration and Current-voltage Measurements. Universiti Sains Malaysia, 2017.
Warning: These citations may not always be 100% accurate.