Depth Analysis for Sensitivity Pattern
Section in the Electrical Resistivity using
the 2D Computerized Modeling Method

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Depth Analysis for Sensitivity Pattern Section in the Electrical Resistivity using the 2D Computerized Modeling Method

This paper presents the analysis of depth of investigation factors which are (Zm/a) and (Zm/L). The medium depth of investigation (Zm) from the sensitivity pattern of different arrays influences the array selection which is good enough for planning infield surveys. In this paper, the average maxi...

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Bibliographic Details
Main Author:	Bery, Andy Anderson
Format:	Article
Language:	English
Published:	Mete Oner 2014
Subjects:	QC1-999 Physics
Online Access:	http://eprints.usm.my/36685/ http://eprints.usm.my/36685/1/Depth_Analysis_19%28Z%29_2014%5B1%5D.pdf

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