Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects.

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Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects.

With the increase in signal frequency and the complexity of high-speed interconnects, signal integrity has become a prominent issue in modern electronic devices.

Bibliographic Details
Main Authors:	Goh, Patrick, Ain, Mohd Fadzil
Format:	Conference or Workshop Item
Language:	English
Published:	2014
Subjects:	TK1-9971 Electrical engineering. Electronics. Nuclear engineering
Online Access:	http://eprints.usm.my/28202/ http://eprints.usm.my/28202/1/Fast_S-parameter_Convolution_for_Eye_Diagram_Simulations_of_High-speed_Interconnects.pdf

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