Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects.
With the increase in signal frequency and the complexity of high-speed interconnects, signal integrity has become a prominent issue in modern electronic devices.
| Main Authors: | , |
|---|---|
| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
2014
|
| Subjects: | |
| Online Access: | http://eprints.usm.my/28202/ http://eprints.usm.my/28202/1/Fast_S-parameter_Convolution_for_Eye_Diagram_Simulations_of_High-speed_Interconnects.pdf |
| _version_ | 1848875798395617280 |
|---|---|
| author | Goh, Patrick Ain, Mohd Fadzil |
| author_facet | Goh, Patrick Ain, Mohd Fadzil |
| author_sort | Goh, Patrick |
| building | USM Institutional Repository |
| collection | Online Access |
| description | With the increase in signal frequency and the complexity of high-speed interconnects, signal integrity has become a prominent issue in modern electronic devices. |
| first_indexed | 2025-11-15T16:49:23Z |
| format | Conference or Workshop Item |
| id | usm-28202 |
| institution | Universiti Sains Malaysia |
| institution_category | Local University |
| language | English |
| last_indexed | 2025-11-15T16:49:23Z |
| publishDate | 2014 |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | usm-282022017-11-20T07:22:01Z http://eprints.usm.my/28202/ Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects. Goh, Patrick Ain, Mohd Fadzil TK1-9971 Electrical engineering. Electronics. Nuclear engineering With the increase in signal frequency and the complexity of high-speed interconnects, signal integrity has become a prominent issue in modern electronic devices. 2014 Conference or Workshop Item PeerReviewed application/pdf en http://eprints.usm.my/28202/1/Fast_S-parameter_Convolution_for_Eye_Diagram_Simulations_of_High-speed_Interconnects.pdf Goh, Patrick and Ain, Mohd Fadzil (2014) Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects. In: Seoul International Conference On Applied Science & Engineering 2014, 29 - 31 August 2014, Seoul, Korea Selatan. (Submitted) |
| spellingShingle | TK1-9971 Electrical engineering. Electronics. Nuclear engineering Goh, Patrick Ain, Mohd Fadzil Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects. |
| title | Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects. |
| title_full | Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects. |
| title_fullStr | Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects. |
| title_full_unstemmed | Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects. |
| title_short | Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects. |
| title_sort | fast s-parameter convolution for eye diagram simulations of high-speed interconnects. |
| topic | TK1-9971 Electrical engineering. Electronics. Nuclear engineering |
| url | http://eprints.usm.my/28202/ http://eprints.usm.my/28202/1/Fast_S-parameter_Convolution_for_Eye_Diagram_Simulations_of_High-speed_Interconnects.pdf |