Reliability analysis of multibit error correcting coding and comparison to hamming product code for on-chip interconnect

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Reliability analysis of multibit error correcting coding and comparison to hamming product code for on-chip interconnect

Error control schemes became a necessity in network-on-chip (NoC) to improve reliability as the on-chip interconnect errors increase with the continuous shrinking of geometry. Accordingly, many researchers are trying to present multi-bit error correction coding schemes that perform a high error corr...

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Bibliographic Details
Main Authors:	Chlaab, Asaad Kadhum, Flayyih, Wameedh Nazar, Rokhani, Fakhrul Zaman
Format:	Article
Language:	English
Published:	University of Baghdad 2020
Online Access:	http://psasir.upm.edu.my/id/eprint/87456/ http://psasir.upm.edu.my/id/eprint/87456/1/Reliability%20analysis%20of%20multibit.pdf

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