Chlaab, A. K., Flayyih, W. N., & Rokhani, F. Z. (2020). Reliability analysis of multibit error correcting coding and comparison to hamming product code for on-chip interconnect. University of Baghdad.
Chicago Style (17th ed.) CitationChlaab, Asaad Kadhum, Wameedh Nazar Flayyih, and Fakhrul Zaman Rokhani. Reliability Analysis of Multibit Error Correcting Coding and Comparison to Hamming Product Code for On-chip Interconnect. University of Baghdad, 2020.
MLA (9th ed.) CitationChlaab, Asaad Kadhum, et al. Reliability Analysis of Multibit Error Correcting Coding and Comparison to Hamming Product Code for On-chip Interconnect. University of Baghdad, 2020.
Warning: These citations may not always be 100% accurate.