Investigating the impact of on-chip interconnection noise on dynamic thermal management efficiency

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Investigating the impact of on-chip interconnection noise on dynamic thermal management efficiency

Dynamic Thermal Management (DTM) emerged as a solution to address the reliability challenges with thermal hotspots and unbalanced temperatures. DTM efficiency is highly affected by the accuracy of the temperature information presented to the DTM manager. This work aims to investigate the effect of i...

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Bibliographic Details
Main Authors:	Rahimipour, Somayeh, Flayyih, Wameedh Nazar, Kamsani, Noor Ain, Stan, Mircea, Rokhani, Fakhrul Zaman
Format:	Conference or Workshop Item
Language:	English
Published:	IEEE 2015
Online Access:	http://psasir.upm.edu.my/id/eprint/69673/ http://psasir.upm.edu.my/id/eprint/69673/1/Investigating%20the%20impact%20of%20on-chip%20interconnection%20noise%20on%20dynamic%20thermal%20management%20efficiency.pdf

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