Testing static single cell faults using static and dynamic data background

Testing static single cell faults using static and dynamic data background

This work proposes a bit-adjacent Data Background (DB) management scheme to improve fault coverage of March algorithms while simultaneously maintaining the shortest test cycle. Both static and dynamic DB transitions are used in order to detect Deceptive Read Destructive Faults (DRDFs) and Write Dist...

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Bibliographic Details
Main Authors: Zakaria, Nor Azura, Wan Hasan, Wan Zuha, Abdul Halin, Izhal, Mohd Sidek, Roslina, Wen, Xiaoqing
Format: Conference or Workshop Item
Language:English
Published: IEEE 2011
Online Access:http://psasir.upm.edu.my/id/eprint/69132/
http://psasir.upm.edu.my/id/eprint/69132/1/Testing%20static%20single%20cell%20faults%20using%20static%20and%20dynamic%20data%20background.pdf

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