Development Of Software System For Detecting Defective Symbol On IC Chip Using Matrox Imaging Library

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Development Of Software System For Detecting Defective Symbol On IC Chip Using Matrox Imaging Library

In semiconductor fabrication process, symbol or label inspection is one of the main processes that needs to be considered seriously. Errors may occur during the printing process of label or name on the integrated circuit chip (IC). If this occurs, the IC chip may have a wrong name. This will affe...

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Bibliographic Details
Main Author:	Azri, Maaspaliza
Format:	Thesis
Language:	English
Published:	2004
Subjects:	Circuits Imaging analysis
Online Access:	http://psasir.upm.edu.my/id/eprint/5945/ http://psasir.upm.edu.my/id/eprint/5945/1/FK_2004_49%20IR.pdf

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