Optical characterization of multi layer thin films using surface plasmon resonance method: from electromagnetic theory to sensor application

Optical characterization of multi layer thin films using surface plasmon resonance method: from electromagnetic theory to sensor application

Surface plasmon resonance (SPR) is a quantum electromagnetic phenomenon arising from the interaction of light with free electrons at a metal-dielectric interface. SPR has emerged as a powerful optical sensor based on the sensing of the change in refractive index of a medium adjacent to the metal sur...

Full description

Bibliographic Details
Main Authors: Yap, Wing Fen, Mat Yunus, Wan Mahmood
Format: Conference or Workshop Item
Language:English
Published: American Institute of Physics 2012
Online Access:http://psasir.upm.edu.my/id/eprint/57450/
http://psasir.upm.edu.my/id/eprint/57450/1/Optical%20characterization%20of%20multi%20layer%20thin%20films%20using%20surface%20plasmon%20resonance%20method%20from%20electromagnetic%20theory%20to%20sensor%20application.pdf

Similar Items

Similar Items