Temperature drift identification in semiconductor gas sensors

The efficiency of metal-oxide (MOX) semiconductor gas sensor is depends on the high accuracy of its performance. In real monitoring situation, the responses of gas sensor are inclined to substantial drift effects that caused by environmental factors (i.e., ambient temperature and humidity) that have...

Full description

Bibliographic Details
Main Authors: Zainul Abidin, Maisarah, Asmat, Arnis, Hamidon, Mohd Nizar
Format: Conference or Workshop Item
Language:English
Published: IEEE 2014
Online Access:http://psasir.upm.edu.my/id/eprint/55919/
http://psasir.upm.edu.my/id/eprint/55919/1/Temperature%20drift%20identification%20in%20semiconductor%20gas%20sensors.pdf
_version_ 1848852936570961920
author Zainul Abidin, Maisarah
Asmat, Arnis
Hamidon, Mohd Nizar
author_facet Zainul Abidin, Maisarah
Asmat, Arnis
Hamidon, Mohd Nizar
author_sort Zainul Abidin, Maisarah
building UPM Institutional Repository
collection Online Access
description The efficiency of metal-oxide (MOX) semiconductor gas sensor is depends on the high accuracy of its performance. In real monitoring situation, the responses of gas sensor are inclined to substantial drift effects that caused by environmental factors (i.e., ambient temperature and humidity) that have reduced the sensor's accuracy. Therefore, the study aims to identify the probable span of drift in sensor responses that was introduced by ambient temperature variation. Two gas sensors (TGS2600 and TGS2602) were used to observe the drift due to ambient temperature variation (25, 30, 35 and 40°C) in exposure of clean air and 6 ppm toluene. The ambient temperature of 25 °C was set as the starting temperature for drifting point, and used as the baseline for identification of drift occurrence. The probable span of drift was later translated into percentage for easy interpretation. Results show that the sensors resistances were drifted in a wide range with their respective drift percentage as the ambient temperature were increased. The resistances for TGS2600 and TGS2602 were drifted up to 57.61 and 61.21 % in clean air while 40.13 and 9.7 % in 6 ppm toluene, respectively. It can be concluded that the probable span of drifted responses has been identified for TGS2600 and TGS2602 in clean air and 6 ppm toluene due to the variation of ambient temperature beyond 25 °C.
first_indexed 2025-11-15T10:46:00Z
format Conference or Workshop Item
id upm-55919
institution Universiti Putra Malaysia
institution_category Local University
language English
last_indexed 2025-11-15T10:46:00Z
publishDate 2014
publisher IEEE
recordtype eprints
repository_type Digital Repository
spelling upm-559192017-06-30T09:54:39Z http://psasir.upm.edu.my/id/eprint/55919/ Temperature drift identification in semiconductor gas sensors Zainul Abidin, Maisarah Asmat, Arnis Hamidon, Mohd Nizar The efficiency of metal-oxide (MOX) semiconductor gas sensor is depends on the high accuracy of its performance. In real monitoring situation, the responses of gas sensor are inclined to substantial drift effects that caused by environmental factors (i.e., ambient temperature and humidity) that have reduced the sensor's accuracy. Therefore, the study aims to identify the probable span of drift in sensor responses that was introduced by ambient temperature variation. Two gas sensors (TGS2600 and TGS2602) were used to observe the drift due to ambient temperature variation (25, 30, 35 and 40°C) in exposure of clean air and 6 ppm toluene. The ambient temperature of 25 °C was set as the starting temperature for drifting point, and used as the baseline for identification of drift occurrence. The probable span of drift was later translated into percentage for easy interpretation. Results show that the sensors resistances were drifted in a wide range with their respective drift percentage as the ambient temperature were increased. The resistances for TGS2600 and TGS2602 were drifted up to 57.61 and 61.21 % in clean air while 40.13 and 9.7 % in 6 ppm toluene, respectively. It can be concluded that the probable span of drifted responses has been identified for TGS2600 and TGS2602 in clean air and 6 ppm toluene due to the variation of ambient temperature beyond 25 °C. IEEE 2014 Conference or Workshop Item PeerReviewed application/pdf en http://psasir.upm.edu.my/id/eprint/55919/1/Temperature%20drift%20identification%20in%20semiconductor%20gas%20sensors.pdf Zainul Abidin, Maisarah and Asmat, Arnis and Hamidon, Mohd Nizar (2014) Temperature drift identification in semiconductor gas sensors. In: 2014 IEEE Conference on System, Process and Control (ICSPC 2014), 12-14 Dec. 2014, Kuala Lumpur, Malaysia. (pp. 63-67). 10.1109/SPC.2014.7086231
spellingShingle Zainul Abidin, Maisarah
Asmat, Arnis
Hamidon, Mohd Nizar
Temperature drift identification in semiconductor gas sensors
title Temperature drift identification in semiconductor gas sensors
title_full Temperature drift identification in semiconductor gas sensors
title_fullStr Temperature drift identification in semiconductor gas sensors
title_full_unstemmed Temperature drift identification in semiconductor gas sensors
title_short Temperature drift identification in semiconductor gas sensors
title_sort temperature drift identification in semiconductor gas sensors
url http://psasir.upm.edu.my/id/eprint/55919/
http://psasir.upm.edu.my/id/eprint/55919/
http://psasir.upm.edu.my/id/eprint/55919/1/Temperature%20drift%20identification%20in%20semiconductor%20gas%20sensors.pdf