APA (7th ed.) Citation

Hock, J. Q., Hassan, Z., Fong, K. Y., Ahmed, N. M., Mohd Salleh, M. A., Matori, K. A., & Lim, W. F. (2017). Effects of ammonia-ambient annealing on physical and electrical characteristics of rare earth CeO2 as passivation film on silicon. Elsevier.

Chicago Style (17th ed.) Citation

Hock, Jin Quah, Zainuriah Hassan, Kwong Yam Fong, Naser Mahmoud Ahmed, Mohammad Amran Mohd Salleh, Khamirul Amin Matori, and Way Foong Lim. Effects of Ammonia-ambient Annealing on Physical and Electrical Characteristics of Rare Earth CeO2 as Passivation Film on Silicon. Elsevier, 2017.

MLA (9th ed.) Citation

Hock, Jin Quah, et al. Effects of Ammonia-ambient Annealing on Physical and Electrical Characteristics of Rare Earth CeO2 as Passivation Film on Silicon. Elsevier, 2017.