APA (7th ed.) Citation

Ong, S. Y. (2014). Improved define-measure-analyze-improve-control methodology for process improvement in semiconductor industry.

Chicago Style (17th ed.) Citation

Ong, Siew Ying. Improved Define-measure-analyze-improve-control Methodology for Process Improvement in Semiconductor Industry. 2014.

MLA (9th ed.) Citation

Ong, Siew Ying. Improved Define-measure-analyze-improve-control Methodology for Process Improvement in Semiconductor Industry. 2014.

Warning: These citations may not always be 100% accurate.