Development of automated neighborhood pattern sensitive fault syndrome generator for SRAM

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Development of automated neighborhood pattern sensitive fault syndrome generator for SRAM

With the increasing complexity of memory devices, fault diagnosis is becoming as important as fault detection. Fault diagnosis is to locate and identify type of fault. One of the memory faults is Neighborhood Pattern Sensitive Faults (NPSF) which is one of the faults that are hard to test due to hig...

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Bibliographic Details
Main Authors:	Rusli, Julie Roslita, Mohd Sidek, Roslina, Wan Hasan, Wan Zuha
Format:	Conference or Workshop Item
Language:	English
Published:	IEEE 2012
Online Access:	http://psasir.upm.edu.my/id/eprint/47621/ http://psasir.upm.edu.my/id/eprint/47621/1/neighborhood%20pattern%20sensitive%20fault.pdf

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